Nondegenerate pump and probe spectroscopy in InGaN thin films

Journal of Applied Physics

Volumn 94, Issue 10, 2003, Pages 6468-6471

  Nomura, Masahiro ^a   Arita, Munetaka ^b   Arakawa, Yasuhiko ^a,b   Ashihara, Satoshi ^a   Kako, Satoshi ^a   Nishioka, Masao ^a   Shimura, Tsutomu ^a   Kuroda, Kazuo ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPOSITION; ELECTRIC FIELDS; EXCITONS; LIGHT ABSORPTION; PHOTOLUMINESCENCE; PIEZOELECTRICITY; QUENCHING; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

NONDEGENERATE FEMTOSECOND PUMPS; PHOTOINDUCED CARRIERS;

THIN FILMS;

EID: 0344084251     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1622111     Document Type: Article

References (14)

1. S. Nakamura, M. Senoh, N. Iwasa, and S. Nagahama, Jpn. J. Appl. Phys., Part 2 34, L797 (1995).
2. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoko, and Y. Sugimoto, Jpn. J. Appl. Phys., Part 2 35, L74 (1996).
3. T. Takeuchi, S. Sota, M. Katsuragawa, M. Komori, H. Takeuchi, H. Amano, and I. Akasaki, Jpn. J. Appl. Phys., Part 2 36, L382 (1997).
4. S. Chichibu, T. Azuhata, T. Sota, and S. Nakamura, Appl. Phys. Lett. 69, 4188 (1996).
5. T. Takeuchi, C. Wetzel, S. Yamaguchi, H. Sakai, H. Amano, I. Akasaki, Y. Kaneko, S. Nakagawa, Y. Yamaoka, and N. Yamada, Appl. Phys. Lett. 73, 1691 (1998).
6. L.-H. Peng, C.-W. Chuang, and L.-H. Lou, Appl. Phys. Lett. 74, 795 (1999).
7. T. Wang, D. Nakagawa, J. Wang, T. Sugahara, and S. Sakai, Appl. Phys. Lett. 73, 3571 (1998).
8. K. Omae, Y. Kawakami, Y. Narukawa, Y. Watanabe, T. Mukai, and Sg. Fujita, Phys. Status Solidi A 190, 93 (2002).
9. F. Chen, M. C. Cheung, P. M. Sweeney, W. D. Kirkey, M. Furis, and A. N. Cartwright, J. Appl. Phys. 93, 4933 (2003).
10. I. Ho and G. B. Stringfellow, Appl. Phys. Lett. 69, 2701 (1996).
11. F. Renner, P. Kiesel, G. H. Döhler, M. Kneissl, C. G. Van de Walle, and N. M. Johnson, Appl. Phys. Lett. 81, 490 (2002).
12. Y. Kawakami, Y. Narukawa, K. Sawada, S. Saijyp, Sz. Fujita, Sg. Fujita, and S. Nakamura, Mater. Sci. Eng., B 50, 256 (1997).
13. X. A. Cao, E. B. Stokes, P. M. Sandvik, S. F. LeBoeuf, J. Kretchmer, and D. Walker, IEEE Electron Device Lett. 23, 535 (2002).
14. A. M. Glass, D. D. Nolte, D. H. Olson, G. E. Doran, D. S. Chemla, and W. H. Knox, Opt. Lett. 15, 264 (1990).