Raman/Rayleigh study of nanophases

Ceramic Engineering and Science Proceedings

Volumn 24, Issue 4, 2003, Pages 41-50

  Colomban, Philippe ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL BONDS; DIFFUSION; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; SILICON CARBIDE; SOLID STATE DEVICE STRUCTURES;

ELECTRODE FILMS;

CERAMIC MATERIALS;

EID: 0344036186     PISSN: 01966219     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)

1. Ph. Colomban, "Gel Technology in Ceramics, Glass-Ceramics and Ceramic-Ceramic Composites", Ceramics International 15 [1], 23-50 (1989).
2. L. C. Klein (Ed.), Sol-Gel Technology, Noyes Publications, Park-Ridge, New-Jersey (1988).
3. Ph. Colomban, G. Sagon and X. Faurel, " Differentiation of Antique Ceramics from the Raman Spectra of their Colored Glazes and Paintings", J. Raman Spectr. 32 [5] 351-60 (2001).
4. Ph. Colomban, G. Gouadec and L. Mazerolles, " Raman Analysis of Materials Corrosion : The Example of SiC Fibers", Materials and Corrosion 53 [5] 306-15 (2002).
5. J.P. Schnell, G. Velasco, M. Croset, D. Dubreuil, D. Dieumegard and Ph. Colomban, "Hydrogenated β Alumina-like Thin Film", Solid State Ionics 9/10, 1465-58 (1983).
6. G. Goudec, Ph. Colomban and N. P. Bansal, "Raman Study of Hi-Nicalon Fiber Reinforced Celsian Composites. Part I: Distribution and Nanostructure of Different Phases", J. Amer. Ceram. Soc. 84 [5] 1129-35 (2001).
7. C. Bernay, A. Ringuede, Ph. Colomban, D. Lincot, M. Cassir, "Yttria-doped Zirconia Thin Films Deposited by Atomic Layer Deposition ALD - A Structural, Morphological and Electrical Characterization", xxx (2002)
8. U. Lavrencic-Stangar, B. Orel, N. Groselj, Ph. Colomban, E Statthatos and P. Lianos, " In-situ Resonance Raman Studies of a Dye-Sensitized Photoelectrochemical Cell with a Sol-Gel Electrolyte", J. Electrochemical Soc. 149 [11] E413-23 (2002).
9. 4 Films Charged/Discharged in the 0
10. A. Surca-Vuk, B. Orel, G. Drazic and Ph. Colomban, " Vibrational Spectroscopy and Analytical Electron Microscopy Studies of Fe-V-O and In-V-O Thin Films", in Nanostructured Materials, H. Hofman, Z. Rahman and U. Schubert (Eds), Springer, Wien-NewYork, 2002 153-172.
11. I. Kosacki, V. Petrovsky, H.U. Anderson and Ph. Colomban, " Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films", J. Amer. Ceram. Soc 85 [11] 2646-50 (2002).
12. 2 systems synthesized through alkoxide hydrolysis gel routes. Microstructure and fractography.", J. Material Sci. 26 3503-10 (1991).
13. M.I. Vasilevskiy, A.G. Rolo and M.J. Gomes, " One-Phonon raman Scattering from Arrays of Semi-conductor Nano-crystals", Sol. State Comm, 104 [7], 381-86 (1997).
14. D. Routkevich, T.L. Halett, L. Ryan, T. Bigioni, C. Douketis and M. Moskovits, " Synthesis and resonance Raman spectroscopy of CdS Nano-wire", Chem. Phys. 210, 343-52 (1996).
15. 2", Nanostruct. Mat. 11 [7] 831-35 (1999).
16. 2 Thin Films", Solid State Ionics, 149 [1-2] 99-105 (2002).
17. M. Havel and Ph. Colomban, to be published.
18. P. Parayanthal and F.H. Pollak, "Raman Scattering in Alloy Semiconductors: Spatial Correlation Model", Phys. Rev. Lett. 52 1822-25 (1984).
19. 2 : Second-Order Scattering, Lattice Dynamics and Particle-Size Effects", Phys. Rev. B 48 178-185 (1993).
20. D.W. Feldman, J.H. Parker, W.J. Choyke and L. Patrick, " Phonon Dispersion Curves by Raman Scattering in SiC, Polytypes 3C, 4H, 6H, 15R and 21R", Phys. Rev. 173 3787-93 (1968).
21. Ph. Colomban and G. Gouadec, "Non-Destructive Mechanical Characterization of (Nano-sized) Ceramic Fibers", Key Engineering Materials, 206-213 677-80 (2002).
22. Ph. Colomban, and M. Havel, "Raman Imaging of Stress-induced Phase Transformation in Transparent ZnSe Ceramics and Sapphire Single Crystal", J. Raman Spectr. 33 [10] 789-95 (2002).
23. M.S. Amer, J. Busbee, S.R. Leclair, J.F. Maguire, J. Johns and A. Voevodin', "Non-destructive In situ Measurements of Diamond-like-Carbon Film Hardness using Raman Scattering", J. Raman Spectr. 30 [10] 947-50 (1999).