3-D nanomanipulation using atomic force microscopy

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 3, Issue , 2003, Pages 3642-3647

  Li, Guangyong ^a   Xi, Ning ^a   Yu, Mengmeng ^a   Fung, Wai Keung ^a  

^a Michigan State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COLLISION AVOIDANCE; CUTTING; END EFFECTORS; FEEDBACK CONTROL; INTERFACES (COMPUTER); MOTION PLANNING; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE TOPOGRAPHY; THREE DIMENSIONAL;

CANTILEVER TIP; NANOMANIPULATION;

MANIPULATORS;

EID: 0344033779     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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