Trace element analysis with the electron microprobe: New data and perspectives

American Mineralogist

Volumn 84, Issue 1-2, 1999, Pages 70-77

  Fialin, Michel ^a   Rémy, Hubert ^a   Richard, Claudine ^a   Wagner, Christiane ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b EUROPEAN SPACE AGENCY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; RARE EARTHS; TRACE ELEMENTS; TRANSITION METALS;

COMMERCIAL SOFTWARE; DETECTION LIMITS; ELECTRON MICROPROBES; HOMOGENEOUS SAMPLES; MELTING PROCESS; SENSITIVE MATERIALS; TRACE ELEMENT ANALYSIS; VOLATILE ELEMENTS;

TRACE ANALYSIS;

ANALYTICAL METHOD; ELECTRON MICROSCOPY; GLASS; IGNEOUS GEOCHEMISTRY; REFERENCE SAMPLE; TRACE ELEMENT;

EID: 0344026188     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1999-1-207     Document Type: Article

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