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Volumn 52, Issue 6, 2003, Pages 1765-1770
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A Displacement-Measuring Instrument Utilizing Self-Mixing Interferometry
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Author keywords
Laser measurements; Optical feedback; Optical interferometry; Rough surfaces; Semiconductor lasers; Speckle
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Indexed keywords
DIGITAL SIGNAL PROCESSING;
FIELD PROGRAMMABLE GATE ARRAYS;
LASER BEAMS;
LIQUID CRYSTALS;
SEMICONDUCTOR LASERS;
SPECKLE;
LASER MEASUREMENT;
OPTICAL FEEDBACK;
ROUGH SURFACES;
INTERFEROMETRY;
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EID: 0344013022
PISSN: 00189456
EISSN: None
Source Type: Journal
DOI: 10.1109/TIM.2003.820451 Document Type: Article |
Times cited : (108)
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References (8)
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