Interferometric measurements of displacement on a diffusing target by a speckle tracking technique

IEEE Journal of Quantum Electronics

Volumn 37, Issue 6, 2001, Pages 800-806

  Norgia, M ^a   Donati, S ^a   D'Alessandro, D ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

Laser measurements; Optical feedback; Optical interferometry; Rough surfaces; Semiconductor lasers; Speckle

Indexed keywords

DISTANCE MEASUREMENT; ERRORS; FEEDBACK; INTERFEROMETERS; LASER APPLICATIONS; OPTICAL VARIABLES MEASUREMENT; SEMICONDUCTOR LASERS; SPECKLE; STATISTICAL OPTICS;

INJECTION INTERFEROMETER; LASER INTERFEROMETER; LASER MEASUREMENTS; OPTICAL FEEDBACK; OPTICAL INTERFEROMETRY; SPECKLE STATISTICS; SPECKLE TRACKING;

INTERFEROMETRY;

EID: 0035371464     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.922778     Document Type: Article

References (8)

1. Statistical properties of lase speckle patterns
2. Speckle-pattern intensity and phase second-order conditional statistics
3. Laser diode feedback interferometer for measurement of displacements without ambiguity
4. A PC-interfaced, compact laser-diode feedback interferometer for displacement measurements
5. Optical feedback interferometry for sensing applications