Microscopic measurement of penetration depth in YBa2Cu3O7-δ thin films by scanning Hall probe microscopy

Superconductor Science and Technology

Volumn 10, Issue 1, 1997, Pages 17-20

  Oral, A ^a   Bending, S J ^a   Humphreys, R G ^b   Henini, M ^c  

^a UNIVERSITY OF BATH   (United Kingdom)

^b DRA   (United Kingdom)

^c UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343924021     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/10/1/003     Document Type: Article

References (24)

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