Measurement of band offsets and interface charges by the C-V matching method

Journal of Applied Physics

Volumn 84, Issue 2, 1998, Pages 1113-1120

  Nemirovsky, Y ^a   Gordon, G ^a   Goren, D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343890196     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368111     Document Type: Article

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