Compact optical trapping microscope using a diode laser

Measurement Science and Technology

Volumn 11, Issue 12, 2000, Pages 1778-1785

  Ulanowski, Z ^a   Ludlow, K I ^a  

^a UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FORCE MEASUREMENT; SEMICONDUCTOR LASERS;

LASER TWEEZERS; OPTICAL TRAPPING;

OPTICAL MICROSCOPY;

EID: 0343725696     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/12/318     Document Type: Article

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