Surface and thin film analysis with electron and mass spectrometric techniques

Materials Science Forum

Volumn 287-288, Issue , 1998, Pages 61-84

  Wucher, A ^a  

^a Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

Author keywords

Analysis; Electron Spectroscopy; Mass Spectroscopy

Indexed keywords

EID: 0343597545     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (36)

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