Shell-wise oxidation of nanocrystalline silicon observed by X-ray diffraction and TEM

New Journal of Chemistry

Volumn 22, Issue 7, 1998, Pages 749-752

  Vogel, Walter ^a   Botti, Sabina ^b   Martelli, Stefano ^b   Carlino, Elvio ^c  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b ENEA   (Italy)

^c Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343568087     PISSN: 11440546     EISSN: None     Source Type: Journal    
DOI: 10.1039/a709239c     Document Type: Article

References (11)

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