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Volumn 17, Issue 7, 1998, Pages 527-529

Nanocrystalline silicon with twin faults and reduced Debye temperature

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; POWDERS; PYROLYSIS; SILANES; SINGLE CRYSTALS; STACKING FAULTS; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; X RAY DIFFRACTION;

EID: 0032049229     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006505200323     Document Type: Article
Times cited : (4)

References (28)
  • 15
    • 0003472812 scopus 로고
    • Addison-Wesley Publishing Company Reading, Massachusetts
    • B. E. WARREN, in "X-Ray Diffraction" (Addison-Wesley Publishing Company Reading, Massachusetts 1969), p. 275.
    • (1969) X-Ray Diffraction , pp. 275
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.