Measurement of fly height by scattered total internal reflection

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 5381-5383

  Lo, Jenny L ^a   Sides, Paul J ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343515150     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364547     Document Type: Article

References (6)

1. Y. Li and A. Menon, IEEE Trans. Magn. 32, 129 (1996).
2. E. Hotaling, Data Storage 3, 41 (1996).
3. J. Wallace and J. Pavlat. Data Storage 1, 55 (1995).
4. P. Sides and J. Lo. Appl. Phys. Lett. 69, 141 (1996).
5. P. Sides, U.S. Patent, pending.
6. D. Prieve J. Walz. Appl. Opt. 32, 1629 (1993).