SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 373, Issue 1-2, 2000, Pages 117-121

Rutherford backscattering analysis of Bi-based superconducting films

(5) Cheang Wong, J C a Diaz Valdes E b Jergel, M c Morales, A c Vargas, R d

a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO (Mexico)

b INSTITUTO POLITÉCNICO NACIONAL (Mexico)

c DEPARTAMENTO DE FÍSICA (Mexico)

d Escla Sup Ing Quim Industrias E (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOLS; ANNEALING; ATOMIZATION; BISMUTH COMPOUNDS; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; PYROLYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

PRECURSOR FILMS; SPRAY PYROLYSIS;

SUPERCONDUCTING FILMS;

EID: 0343408412 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(00)01116-0 Document Type: Article

Times cited : (3)

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