Correlation between the Tl concentration depth profiles and the thallination time in Tl-Ba-Ca-Cu-O superconducting films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 1300-1305

  Cheang Wong, J C ^a   Jergel, M ^b,c   Andrade, E ^a   Falcony, C ^b   Morales, A ^b   Conde Gallardo, A ^b  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

^c INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

Author keywords

Chemical composition; Concentration depth profiles; HTc superconductivity; IBA techniques; Tl based films

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC RESISTANCE; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; SUPERCONDUCTIVITY; SYNTHESIS (CHEMICAL); THALLIUM COMPOUNDS; YTTRIUM; ZIRCONIA;

CONCENTRATION DEPTH PROFILES; NUCLEAR REACTION ANALYSIS; THALLINATION;

SUPERCONDUCTING FILMS;

EID: 0032019468     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00841-0     Document Type: Article

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