|
Volumn 56, Issue 10, 2000, Pages 1901-1903
|
Electronic absorption and Raman resonance scattering of spectroscopically pure SiO2
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ABSORPTION SPECTROSCOPY;
ELECTRONIC STRUCTURE;
PHOTOLYSIS;
RAMAN SCATTERING;
ULTRAVIOLET SPECTROSCOPY;
ANTI-STOKES RAMAN RESONANCE SCATTERING;
STOKES RAMAN RESONANCE SCATTERING;
SILICA;
SILICON DIOXIDE;
ARTICLE;
CHEMISTRY;
INFRARED SPECTROPHOTOMETRY;
METHODOLOGY;
RAMAN SPECTROMETRY;
SILICON DIOXIDE;
SPECTROPHOTOMETRY, INFRARED;
SPECTRUM ANALYSIS, RAMAN;
|
EID: 0343389553
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/S1386-1425(00)00247-X Document Type: Article |
Times cited : (8)
|
References (10)
|