Simple procedure to determine the complex permittivity of materials without ambiguity from reflection measurements

Microwave and Optical Technology Letters

Volumn 25, Issue 3, 2000, Pages 191-194

  Catala Civera J M ^a   Penaranda Foix F ^a   Sanchez Hernandez D ^b   De Los Reyes, E ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

^b TECHNICAL UNIVERSITY OF CARTAGENA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; DIELECTRIC WAVEGUIDES; ERROR ANALYSIS; FREQUENCIES; MICROWAVE MEASUREMENT;

AUTOMATIC NETWORK ANALYZER; COMPLEX PERMITTIVITY; REFLECTION MEASUREMENTS; SHORT CIRCUITED WAVEGUIDES;

PERMITTIVITY;

EID: 0343341610     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1098-2760(20000505)25:3<191::AID-MOP10>3.0.CO;2-5     Document Type: Article

References (10)

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