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Volumn 42, Issue 17, 2001, Pages 7349-7362

Hydrophobic recovery of polydimethylsiloxane after exposure to partial discharges as a function of crosslink density

Author keywords

Electrical discharges; Hydrophobicity; Polydimethylsiloxane

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; ELECTRON MICROSCOPY; OLIGOMERS; OPTICAL MICROSCOPY; OXIDATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0343337272     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(01)00202-6     Document Type: Article
Times cited : (137)

References (33)
  • 7
    • 0000133665 scopus 로고
    • Silicon-based polymer science, a comprehensive resource
    • J.M. Ziegler, & F.W.G. Fearon. Washington, DC: American Chemical Society
    • Owen M.J. Ziegler J.M., Fearon F.W.G. Silicon-based polymer science, a comprehensive resource. Adv Chem Ser 224. 1990;American Chemical Society, Washington, DC.
    • (1990) Adv Chem Ser 224
    • Owen, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.