Electrical conduction studies on Bi2(Te0.8Se0.2)3 chalcogenide thin films

Solid State Communications

Volumn 111, Issue 1, 1999, Pages 43-48

  Das, V Damodara ^a   Selvaraj, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON DIFFRACTION; FILM PREPARATION; GRAIN BOUNDARIES; SEMICONDUCTING BISMUTH COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

CHALCOGENIDE THIN FILMS; THERMAL VIBRATIONS;

SEMICONDUCTING FILMS;

EID: 0343325768     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(99)00125-8     Document Type: Article

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