Thickness and temperature effects on thermoelectric properties of Pb0.6Sn0.4Te thin films

Journal of Applied Physics

Volumn 80, Issue 3, 1996, Pages 1633-1639

  Damodara Das, V ^a   Bahulayan, C ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON DIFFRACTION; FERMI LEVEL; MATHEMATICAL MODELS; SEMICONDUCTING LEAD COMPOUNDS; THERMAL CONDUCTIVITY; THERMAL EFFECTS; THERMOELECTRICITY; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

EFFECTIVE MEAN FREE PATH MODEL; LEAD TIN TELLURIDE; SELECTED AREA ELECTRON DIFFRACTION; THERMOELECTRIC POWER MEASUREMENT; THICKNESS EFFECTS;

THIN FILMS;

EID: 0342388120     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362962     Document Type: Article

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