High-resolution calorimetry: limitations of doped semiconductor thermometers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 436, Issue 1-2, 1999, Pages 205-211

  McCammon, D ^a   Almy, R ^a   Apodaca, E ^a   Deiker, S ^a   Galeazzi, M ^a   Han, S I ^a   Lesser, A ^a   Sanders, W ^a   Kelley, R L ^b   Moseley, S H ^b   Porter, F S ^b   Stahle, C K ^b   Szymkowiak, A E ^b  

^a University of Wisconsin Madison   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; CRYOGENICS; IONIZATION; OPTICAL RESOLVING POWER; OPTIMIZATION; PHONONS; SEMICONDUCTOR DOPING; SILICON SENSORS; SPURIOUS SIGNAL NOISE; THERMOMETERS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYOGENIC TEMPERATURES; ELECTRON PHONON DECOUPLING; ENERGY RESOLUTION; EXCESS NOISE; SILICON IONIZATION DETECTOR; THERMAL CALORIMETERS; X RAY PHOTON;

CALORIMETRY;

EID: 0343193335     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00622-1     Document Type: Article

References (4)

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2. Moseley S.H., Mather J.C., McCammon D. J. Appl. Phys. 56:1984;1257.
3. Zhang J.et al. Phys. Rev. B. 57:1998;4472.
4. S.-I. Han et al., in: O.H. Siegmund, M.A. Gumin (Eds.), EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, Proceedings of SPIE, Vol. 3445, 1998, p. 978.