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Volumn 69, Issue 1-4, 1999, Pages 165-179

Surface chemical characterization of copper oxide and its relationship to adhesion in formed epoxy/copper interfaces

Author keywords

Chemical analysis; Copper oxidation; Epoxy copper adhesion; LEEIXS; Mechanical testing; SEM; Three point flexure; XPS

Indexed keywords


EID: 0343189225     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/00218469908015924     Document Type: Article
Times cited : (8)

References (29)
  • 25
    • 5844260681 scopus 로고
    • Thesis, Paris
    • Bonnelle, C., Thesis, Paris, 1964.
    • (1964)
    • Bonnelle, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.