Determination of grain-boundary diffusion coefficients by Auger electron spectroscopy

Applied Surface Science

Volumn 162, Issue , 2000, Pages 213-218

  Erdelyi Z ^a,b   Girardeaux, Ch ^a   Langer, G A ^b   Daroczi L ^b   Rolland, A ^a   Beke, D L ^b  

^a AIX MARSEILLE UNIVERSITY   (France)

^b UNIVERSITY OF DEBRECEN   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; CRYSTAL ATOMIC STRUCTURE; DIFFUSION IN SOLIDS; GRAIN BOUNDARIES; HEAT TREATMENT; NANOSTRUCTURED MATERIALS; SILVER; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

HWANG-BALLUFFI METHOD; SURFACE ACCUMULATION METHOD;

METALLIC FILMS;

EID: 0343006794     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00194-X     Document Type: Article

References (15)

1. Hwang J.C.M., Pan J.D., Balluffi R.W. J. Appl. Phys. 50(3):1979;1339.
2. Hondros E.D., Seah M.P. Scr. Metall. 6:1972;1007.
3. Wynblatt P., Ku R.C. Surf. Sci. 65:1977;511.
4. Seah M.P. J. Catal. 57:1979;450.
5. Abraham F.F., Brundle C.R. J. Vac. Sci. Technol. 18:1981;506.
6. Dowben P.A., Miller A.H., Vook R.W. Gold Bull. 20(3):1987;54.
7. Du Plessis J., Taglauer E. Surf. Sci. 260:1992;355.
8. Gupta D., Ho P.S. Thin Solid Films. 72:1980;399.
9. Surholt T., Herzig C.H.R. Acta Mater. 45(9):1997;3817.
10. Beke D.L., Langer G.A., Kis-Varge M., Dudas A., Nemes P., Daróczi L., Kerekes Gy., Erdélyi Z. Vacuum. 50(3/4):1998;373.
11. Barthès M.G., Rolland A. Thin Solid Films. 76:1981;45.
12. Gibson M.J., Dobson P.J. J. Phys. F: Met. Phys. 5:1975;864.
13. Bukaluk A., Rozwadowski M., Siuda R. Appl. Phys. A. 34:1984;193.
14. Gilmer G.H., Farrell H.H. J. Appl. Phys. 47:1976;3792.
15. Seah M.P., Dench W.A. Surf. Interface Anal. 1(1):1979;2.