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Volumn 55, Issue 7, 2000, Pages 767-778

Time-of-flight mass spectrometry as a tool for speciation analysis

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; ELECTROPHORESIS; GAS CHROMATOGRAPHY; GLOW DISCHARGES; ION SOURCES; IONIZATION; IONS; MOLECULAR SPECTROSCOPY; PLASMA APPLICATIONS; PLASMA SOURCES;

EID: 0342955746     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(00)00181-6     Document Type: Article
Times cited : (40)

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