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Volumn 164, Issue , 2000, Pages 460-470
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Fluctuations and correlations in sputtering and defect generation in collision cascades in Si
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
COMPUTATIONAL METHODS;
COMPUTER SOFTWARE;
CORRELATION METHODS;
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL DEFECTS;
FUNCTIONS;
ION BEAMS;
ION BOMBARDMENT;
METHOD OF MOMENTS;
RADIATION DAMAGE;
SEMICONDUCTING GERMANIUM;
SOFTWARE PACKAGE MARLOWE;
SEMICONDUCTING SILICON;
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EID: 0342906542
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)01137-4 Document Type: Article |
Times cited : (11)
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References (19)
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