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Volumn 164, Issue , 2000, Pages 460-470

Fluctuations and correlations in sputtering and defect generation in collision cascades in Si

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPUTATIONAL METHODS; COMPUTER SOFTWARE; CORRELATION METHODS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; FUNCTIONS; ION BEAMS; ION BOMBARDMENT; METHOD OF MOMENTS; RADIATION DAMAGE; SEMICONDUCTING GERMANIUM;

EID: 0342906542     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01137-4     Document Type: Article
Times cited : (11)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.