Instrumental aspects ofmagnetic resonance force microscopy

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Streckeisen, P ^a   Rast, S ^a   Wattinger, C ^a   Meyer, E ^a   Vettiger, P ^b   Gerber, Ch ^b   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD GRADIENT; FORCE MICROSCOPY; FORCE SENSITIVITY; LIQUID PHASE; Q-FACTORS; ROOM TEMPERATURE; SAMPLE PREPARATION TECHNIQUES;

MAGNETIC FIELDS; Q FACTOR MEASUREMENT;

NANOCANTILEVERS;

EID: 0342780846     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051159     Document Type: Article

References (14)

1. J.A. Sidles: Appl. Phys. Lett. 58, 2854 (1991)
2. J.A. Sidles: Phys. Rev. Lett. 68, 1124 (1992)
3. J.A. Sidles, J.L. Garbini, G.P. Dorbny: Rev. Sci. Instrum. 63, 3881 (1992)
4. D. Rugar, C.S. Yannoni, J.A. Sidles: Nature 360, 563 (1992)
5. O. Züger, D. Rugar: J. Appl. Phys. 75, 6211 (1994)
6. O. Züger, D. Rugar: Appl. Phys. Lett. 63, 2496 (1993)
7. D. Rugar, O. Züger, S. Hoen, C.S. Yannoni, H.-M. Vieth, R.D. Kendrick: Science 264, 1560 (1994)
8. K.J. Bruland, J. Krzystek, J.L. Garbini, J.A. Sidles: Rev. Sci. Instrum. 66, 2853 (1995)
9. S. Hoen, O. Züger, C.S. Yannoni, H.J. Mamin, K. Wago, D. Rugar: Solid State Sensor and Actuator Workshop, June, 1994
10. P.C. Hammel, Z. Zhang, G.J. Moore, M.L. Roukes: J. Low-Temp. Phys. 101, 59 (1995)
11. O. Züger, S.T. Hoen, C.S. Yannoni, D. Rugar: J. Appl. Phys. 79, 1881 (1996)
12. Z. Zhang, P.C. Hammel, G.J. Moore: Rev. Sci. Instrum. 67, 3307 (1996)
13. K. Wago, O. Züger, R. Kendrick, C.S. Yannoni, D. Rugar: J. Vac. Sci. Technol. B 14, 1197 (1996)
14. J.A. Sidles, J.L. Garbini, K.J. Bruland, D. Rugar, O. Züger, S. Hoen, C.S. Yannoni: Rev. Mod. Phys. 67, 249 (1995)