메뉴 건너뛰기




Volumn 7, Issue , 1997, Pages 312-315

Efficient functional diagnosis for synchronous sequential circuits based on and/or graphs

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; FINITE AUTOMATA; GRAPH THEORY; HEURISTIC METHODS; OPTIMIZATION; SEQUENTIAL CIRCUITS;

EID: 0342755308     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (10)
  • 2
    • 1842784295 scopus 로고
    • Methods for automatic design error correction in sequential circuits
    • M. Fujita. Methods for automatic design error correction in sequential circuits. In European Design & Test Conf., pages 76-80, 1993.
    • (1993) European Design & Test Conf. , pp. 76-80
    • Fujita, M.1
  • 3
    • 0343207158 scopus 로고
    • An application of the information theory approach to failure diagnosis
    • E.J. Kletsky. An application of the information theory approach to failure diagnosis. IRE Trans. on Reliability and Quality Control, 9:29-39, 1960.
    • (1960) IRE Trans. on Reliability and Quality Control , vol.9 , pp. 29-39
    • Kletsky, E.J.1
  • 5
    • 0025456824 scopus 로고
    • Application of heuristic search and information theory to sequential fault diagnosis
    • K.R. Pattipati and M.G. Alexandridis. Application of heuristic search and information theory to sequential fault diagnosis. IEEE Trans. on Systems, Man, and Cybernetics, 20:872-887, 1990.
    • (1990) IEEE Trans. on Systems, Man, and Cybernetics , vol.20 , pp. 872-887
    • Pattipati, K.R.1    Alexandridis, M.G.2
  • 9
    • 0030121399 scopus 로고    scopus 로고
    • A method for automatic design error location and correction in combinational logic circuits
    • A. Wahba and D. Borrione. A method for automatic design error location and correction in combinational logic circuits. Jour. of Electronic Testing: Theory and Applications, 8:113-127, 1996.
    • (1996) Jour. of Electronic Testing: Theory and Applications , vol.8 , pp. 113-127
    • Wahba, A.1    Borrione, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.