Processing of infrared spectroscopy data on thin porous films using software "prospect"

Journal of Porous Materials

Volumn 7, Issue 1-3, 2000, Pages 239-242

  Parkhutik, V ^a   San Jeronimo Martinez M ^a   Gomez Senent E ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Infrared spectroscoy; Interference fringes; Porous silicon

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; DATA REDUCTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT INTERFERENCE; REFRACTIVE INDEX; SPECTROPHOTOMETRY; THIN FILMS;

SOFTWARE PACKAGE PROSPECT;

POROUS SILICON;

EID: 0342733423     PISSN: 13802224     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1009607409050     Document Type: Article

References (3)

1. V.P. Parkhutik, Programa de Tratamiento de Espectros Infrarrojos "ProSpect", Los Practicas del Laboratorio en Física de Estado Sólido, UPV, Valencia, 1997, p. 123.
2. M. Krüger, R. Arens-Fisher, M. Thönissen, H. Münder, M.G. Berger, H. Lüth, S. Hilbrich, and W. Theiss, Thin Solid Films 276, 257 (1996).
3. M. Born and E. Wolf, Principles of Optics (Oxford Press, 1975).