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Volumn 224, Issue 1-4, 1999, Pages 129-136
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Laser interferometry for piezoelectric material study-possibilities and limits
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELD EFFECTS;
ERROR CORRECTION;
ERROR DETECTION;
INTERFEROMETRY;
LASER APPLICATIONS;
NUMERICAL ANALYSIS;
PIEZOELECTRICITY;
DOUBLE BEAM INTERFEROMETERS;
LASER INTERFEROMETER;
PIEZOELECTRIC DISPLACEMENT;
SINGLE BEAM INTERFEROMETERS;
PIEZOELECTRIC MATERIALS;
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EID: 0342656206
PISSN: 00150193
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1080/00150199908210559 Document Type: Article |
Times cited : (6)
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References (11)
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