Interferometric characterization method of lateral ion exchange for refractive waveguide elements

Pure and Applied Optics (Print edition) (United Kingdom)

Volumn 5, Issue 6, 1996, Pages 919-928

  Linares J ^a   Lopez Lago E ^a   Montero, C ^a   Prieto, X ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GRADIENT INDEX OPTICS; INTERFEROMETRY; ION EXCHANGE; NONDESTRUCTIVE EXAMINATION; OPTICAL FIBER FABRICATION; REFRACTIVE INDEX;

INTERFERENCE MICROSCOPY;

OPTICAL WAVEGUIDES;

EID: 0030281926     PISSN: 09639659     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-9659/5/6/017     Document Type: Article

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