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Journal of Electron Spectroscopy and Related Phenomena

Volumn 113, Issue 2-3, 2001, Pages 241-251

Photoemission Fermi edge as a sample thermometer?

(4) Kroger J a Greber, T b Kreutz, T J b Osterwalder, J b

a UNIVERSITY OF KIEL (Germany)

b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; FERMI LEVEL; FUNCTIONS; PHOTOEMISSION; SINGLE CRYSTALS; SURFACE PHENOMENA; THERMAL EFFECTS; THERMOMETERS;

FERMI-DIRAC DISTRIBUTION FUNCTIONS; LOW INDEX SINGLE CRYSTALS; PHOTOELECTRON EMISSION;

NICKEL;

EID: 0342419444 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(01)00231-6 Document Type: Article

Times cited : (14)

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