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Volumn 402-404, Issue , 1998, Pages 614-622

Angle-scanned photoemission: Fermi surface mapping and structural determination

(13) Aebi, P a Fasel, R a Naumovic D a Hayoz, J a Pillo, Th a Bovet, M a Agostino, R G a Patthey, L a Schlapbach, L a Gil, F P b Berger, H c Kreutz, T J d Osterwalder, J d

a UNIVERSITY OF FRIBOURG (Switzerland)

b UNIVERSITY OF COIMBRA (Portugal)

c EPFL (Switzerland)

d UNIVERSITY OF ZURICH (Switzerland)

Author keywords

Angle scanned photoemission; Band mapping; Fermi surface mapping; Photoelectron diffraction; Surface structure

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; PHOTOEMISSION; PHOTONS; SINGLE CRYSTALS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE SCANNED PHOTOEMISSION; X RAY PHOTOELECTRON DIFFRACTION;

FERMI SURFACE;

EID: 0031633828 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00026-0 Document Type: Article

Times cited : (25)

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