Structural and electrical properties of low-temperature-grown Al(As,Sb)

Applied Physics Letters

Volumn 71, Issue 24, 1997, Pages 3534-3536

  Blank, H R ^a   Kroemer, H ^a   Mathis, S ^a   Speck, J S ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342328218     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120382     Document Type: Article

References (6)

1. G. N. Maracas, K. Shiralagi, R. Ramamurti, and R. W. Carpenter, J. Electron. Mater. 22, 1375 (1993).
2. D. C. Look, Thin Solid Films 231, 61 (1994).
3. H.-R. Blank, S. Mathis, E. Hall, S. Bhargava, A. Behres, M. Heuken, H. Kroemer, and V. Narayanamurti, J. Cryst. Growth (submitted).
4. H.-R. Blank, M. Thomas, K. C. Wong, and H. Kroemer, Appl. Phys. Lett. 69, 2080 (1996).
5. C. Nguyen, B. Brar, H. Kroemer, and J. English, Appl. Phys. Lett. 60, 1854 (1992).
6. G. Tuttle, H. Kroemer, and J. English, J. Appl. Phys. 65, 5239 (1989).