Application of impedance technique to OELD

Thin Solid Films

Volumn 363, Issue 1, 2000, Pages 236-239

  Rhee, Hee Woo ^a   Chin, Kyuong Sik ^a   Oh, Se Young ^a   Choi, Jeong Woo ^a  

^a Sogang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CURRENT DENSITY; ELECTROLUMINESCENCE; SENSITIVITY ANALYSIS; SPECTROSCOPIC ANALYSIS; TRANSPORT PROPERTIES;

IMPEDANCE SPECTROSCOPY; ORGANIC ELECTROLUMINESCENT DEVICE (OELD);

OPTICAL FILMS;

EID: 0342322917     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)01065-2     Document Type: Article

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