Microstructural studies of oxygen irradiated CdTe thin films

Physica Status Solidi (A) Applied Research

Volumn 177, Issue 2, 2000, Pages 495-502

  Sundari, S Tripura ^a   Swaminathan, V ^b   Tyagi, A K ^a   Mahalingam, T ^b  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b ALAGAPPA UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DOSIMETRY; GRAIN GROWTH; GRAIN SIZE AND SHAPE; ION BOMBARDMENT; OXYGEN; SEMICONDUCTING CADMIUM TELLURIDE; STRESS RELAXATION; THIN FILMS;

LATTICE RELAXATION;

SEMICONDUCTING FILMS;

EID: 0342321975     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-396x(200002)177:2<495::aid-pssa495>3.3.co;2-v     Document Type: Article

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