Studies on the quantitative analysis of trace elements in single SiC crystals using laser ablation-ICP-MS

Journal of analytical atomic spectrometry

Volumn 14, Issue 11, 1999, Pages 1679-1684

  Hoffmann, Erwin ^a   Lüdke, Christian ^a   Skole, Jochen ^a   Stephanowitz, Heike ^b   Wagner, Günther ^c  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^b Optoelektronik Quantenoptik und Spektroskopie eV ^*  (Germany)

^c LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; LASER ABLATION; LASER MODES; MASS SPECTROMETRY; NEODYMIUM LASERS; PLASMA APPLICATIONS; Q SWITCHED LASERS; SIGNAL TO NOISE RATIO; SINGLE CRYSTALS; TRACE ANALYSIS; TRACE ELEMENTS;

DETECTION LIMITS; INDUCTIVELY-COUPLED PLASMAS (ICP);

SILICON CARBIDE;

EID: 0342298523     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a904734d     Document Type: Article

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