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Volumn 26, Issue , 1999, Pages
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Effect of underfill on the pressure cooker test performance of flip chip on board assembly
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Author keywords
[No Author keywords available]
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Indexed keywords
FLIP CHIP DEVICES;
INTEGRATED CIRCUIT TESTING;
PRESSURIZATION;
SOLDERED JOINTS;
STRAIN;
THERMAL CYCLING;
FLIP CHIP ON BOARD (FCOB);
PRESSURE COOKER TESTS (PCT);
ELECTRONICS PACKAGING;
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EID: 0342297921
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (5)
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