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Volumn , Issue , 2003, Pages 16-19
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Characterization of Dielectric Materials Using a High-Resolution Scanning Kelvin Microprobe
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC MATERIALS;
ELECTRIC CONTACTS;
ELECTRODES;
MICROSTRUCTURE;
PERMITTIVITY;
SELF ASSEMBLY;
SURFACE TOPOGRAPHY;
HIGH RESOLUTION SCANNING KELVIN MICROPROBES;
ELECTRIC INSULATION;
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EID: 0242676036
PISSN: 00849162
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (3)
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