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Volumn , Issue , 2003, Pages 16-19

Characterization of Dielectric Materials Using a High-Resolution Scanning Kelvin Microprobe

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC CONTACTS; ELECTRODES; MICROSTRUCTURE; PERMITTIVITY; SELF ASSEMBLY; SURFACE TOPOGRAPHY;

EID: 0242676036     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.