High field measurements with a guarded needle

IEEE Electrical Insulation Magazine

Volumn 19, Issue 3, 2003, Pages 19-25

  Cao, Yang ^a   Jiang, Grace Ge ^a,b   Boggs, Steven ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b 3M COMPANY   (United States)

Author keywords

Conduction models; Degradation; Guarded needle manufacture; Protrusions; Space charge; Threshold field

Indexed keywords

CAPACITANCE MEASUREMENT; CARRIER MOBILITY; DIELECTRIC MATERIALS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD MEASUREMENT; MATHEMATICAL MODELS; VOLTAGE MEASUREMENT;

CAPACITIVE CURRENT; ELECTRICAL DEGRADATION; RESISTIVE CURRENT; SOLID DIELECTRICS;

ELECTRIC INSULATION TESTING;

EID: 0038614672     PISSN: 08837554     EISSN: None     Source Type: Journal    
DOI: 10.1109/MEI.2003.1203018     Document Type: Article

References (10)

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