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Volumn 55, Issue 3, 1997, Pages 1741-1747

Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0242675139     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.1741     Document Type: Article
Times cited : (7)

References (37)
  • 1
    • 0021410732 scopus 로고
    • L. Esaki, J. Phys. (Paris) 45, 3 (1984).
    • (1984) J. Phys. (Paris) , vol.45 , pp. 3
  • 10
    • 0000104267 scopus 로고
    • Th. Laloyaux, I. Derycke, J.-P. Vigneron, Ph. Lambin and A. A. Lucas, Phys. Rev. B 47, 7508 (1993).
    • (1993) Phys. Rev. B , vol.47 , pp. 7508
    • Derycke, I.1    Lucas, A.2
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.