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Volumn 55, Issue 3, 1997, Pages 1741-1747
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Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0242675139
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.55.1741 Document Type: Article |
Times cited : (7)
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References (37)
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