Combined X-bar and CRL Charts for the Gamma Process

Computational Statistics

Volumn 18, Issue 4, 2003, Pages 547-563

  Sim, C H ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

Asymmetric control limits; Average run length; Gamma distribution; Monte Carlo simulation; Synthetic chart

Indexed keywords

EID: 0242627512     PISSN: 09434062     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf03354616     Document Type: Article

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