Using of the waveguide light scattering for precision measurements of the statistic parameters of irregularities of integrated optical waveguide's materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4987, Issue , 2003, Pages 299-309

  Yegorov, Alexandre A ^a,b,c  

^a PEOPLES FRIENDSHIP UNIVERSITY OF RUSSIA   (Russian Federation)

^b PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^c Apt 76 ^*  (Russian Federation)

Author keywords

Autocovariance function; Integrated optics; Laser measurements; Noise; Waveguide scattering problems

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; CRACKS; INTEGRATED OPTICS; INVERSE PROBLEMS; LASERS; LIGHT SCATTERING; PERTURBATION TECHNIQUES; PROBLEM SOLVING; REFRACTIVE INDEX; STATISTICAL METHODS; SURFACE PROPERTIES;

AUTOCOVARIANCE FUNCTIONS;

OPTICAL WAVEGUIDES;

EID: 0242609095     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.473171     Document Type: Conference Paper

References (17)

1. V.V. Shevchenko, Continuous Transactions in Open Waveguides, Golem Press, Boulder, Colorado, 1971.
2. D. Marcuse, Light Transmission Optics, Van Nostrand Reinhold Company, New York, 1972.
3. D.J. Walter, J. Houghton, "Attenuation in thin film optical waveguides due to roughness-induced mode coupling," Thin Solid Film, 52, pp. 461-476, 1978.
4. E. Bradley, D.G. Hall, "Out-of-plane scattering from glass waveguides: comparison of theory and experiment," Optics Letters, 7(5), pp. 235-237, 1982.
5. M. Gottlieb, G.B. Brandt, J.J. Conroy, "Out-of-plane scattering in optical waveguides," IEEE Tarns. On Circuit and Systems, CAS-26(12), pp. 1029-1035, 1979.
6. D.G. Hall, "Scattering of optical waves by waveguide surface roughness: a three-dimensional treatment," Optics Letters, 6(12), pp. 601-603, 1981.
7. M. Imai, M. Koseki, Y. Ohtsuka, "Scattering pattern measurement and analysis of sputtered-glass optical waveguides for integrated optics," IEEE Trans. on Microwave Theory and Techniques, MTT-30(4), pp. 635-641, 1982.
8. A.A. Egorov, "Theory of waveguide optical microscopy," Laser Physics, 8(2), pp. 536-540, 1998.
9. A.A. Egorov, "Determination of parameters of a statistical ensemble of microobjects in a waveguide optical microscope," Bulletin of the Russian Academy of Sciences, Physics, 63(6), pp. 894-899, 1999.
10. A.A. Yegorov, "Recovery of the characteristics and determination of the parameters of statistical nanometer surface roughness using the data on scattering in a planar optical waveguide," Radiophysics and Quantum Electronics, Vol. 43(12), pp. 980-988 (2000).
11. A.A. Egorov, "Inverse light scattering problem in a planar waveguide with statistical subwavelength irregularities (theory and computer simulation)," Book of Abstracts of Second International Conference Modem Trends in Computational Physics, July 24-29 2000, P. 163, Dubna, Russia, 2000.
12. A.A. Egorov, "Using waveguide light scattering for determining the autocorrelation function of statistical surface roughness within a wide range of changes of the roughness correlation interval," Quantum Electronics, Vol. 32(4), pp. 357-361 (2002).
13. A.A. Yegorov "A new algorithm of restoring the autocorrelation function of subwavelength statistic surface roughness by light scattering in integrated optical waveguide in the presence of a high additive stochastic noise," Proc. SPIE 4900, Part Two, pp. 792-801 (2002).
14. A.A. Egorov "Waveguide light scattering: correct restoration of the statistic characteristic of the thin films and optical surface irregularities," Proc. SPIE 4829, pp. 591-592 (2002).
15. A.N. Tikhonov, and V.Y. Arsinin, Solution of ill-posed problem, Winston/Willey, Washington, 1977.
16. S.A. Akhmanov, Yu.E. Diakov, A.S. Chirkin, Introduction to Statistic Radiophysics and Optics, Nauka, Moscow, 1981 (in Russian).
17. A.A. Yegorov, "Retrieval of the characteristics and determination of parameters of a statistical nanometer-scale surface roughness by the light scattering data on scattering in a planar optical waveguide in the presence of additive noise," Radiophysics and Quantum Electronics, Vol. 45(7), pp. 577-584 (2002) (in Russian).