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Volumn 515, Issue 1-2, 2003, Pages 335-341
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Further advances in aging studies for RPCs
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Author keywords
Aging; ATLAS; Front end electronics; High rate; RPC
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Indexed keywords
AGING OF MATERIALS;
COBALT;
DEGRADATION;
ELECTRIC FIELDS;
ELECTRODES;
IRRADIATION;
FRONT-END ELECTRONICS;
PARTICLE DETECTORS;
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EID: 0242579630
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2003.09.020 Document Type: Conference Paper |
Times cited : (22)
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References (9)
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