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Volumn 478, Issue 1-2, 2002, Pages 271-276

RPC ageing studies

Author keywords

Ageing; ATLAS; Front end electronics; High rate; RPC

Indexed keywords

DEGRADATION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRODES; GRAPHITE; IRRADIATION;

EID: 0042109432     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01770-3     Document Type: Article
Times cited : (24)

References (6)
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.