Modeling memory phenomena for partial discharge processes in insulation cavities

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2003, Pages 723-727

  Cavallini, A ^a   Ciani, R ^a   Conti, M ^a   Morshuis, P F H ^b   Montanari, G C ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC INSULATION; POWER AMPLIFIERS;

WORK FUNCTIONS;

PARTIAL DISCHARGES;

EID: 0242578490     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. L.Niemeyer, "A Generalized Approach to Partial Discharge Modeling", IEEE Trans. on Dielectrics and Electrical Insulation, Vol. 2, No. 4, pp.510-528, October 1995.
2. A. Cavallini, A. Contin, G. C. Montanari, P. F. Morshuis, F. Puletti, "Theoretical and experimental derivation of partial discharge height distribution models", IEEE CEIDP, pp. 222-226, Austin, USA, October 1999.
3. Morshuis P., Montanari G. C., Cavallini A., Puletti F., Contin A., "Time behavior of physical and stochastic parameters from partial discharges incepted in spherical voids", IEEE ICPADM, pp. 304-309, Xi'an, China, June 2000.
4. A. Cavallini, P. Morshuis, R. Bodega, F. Wester, "The effect of voltage frequency on partial discharge activity", IEEE CEIDP, pp. 685-689, Cancun, Messico, October 2002.
5. G. C. Crichton, P. W. Karlsson, A. Pedersen, "Partial discharges in ellipsoidal and spheroidal voids", IEEE Trans. on Dielectrics and Electrical Insulation, Vol. 24, No. 2, pp.335-342, April 1989.
6. rd Edition March 2001
7. G. C. Montanari, M. Conti, F. Ciani, A. Cavallini, G. Mazzanti, S. Serra' "First electron availability and PD generation in insulation cavities", IEEE CEIDP, Albuquerque, USA, October 2003.
8. M. Meunier, N. Quirke, A. Aslandius, "Characterization of charge carrier traps in polymeric insulations", IEEE CEIDP, Victoria, Canada, pp. 21-24, October 2000.