Behavior of physical and stochastic parameters from partial discharges in spherical voids

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn 1, Issue , 2000, Pages 304-309

  Morshuis, P ^a   Cavallini, A ^a   Montanari, G C ^a   Puletti, F ^a   Contin, A ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC INSULATORS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONS; MONTE CARLO METHODS; PROBABILITY DISTRIBUTIONS;

PARTIAL DISCHARGE MEASUREMENT; SPHERICAL VOIDS; STOCHASTIC PARAMETERS;

PARTIAL DISCHARGES;

EID: 0034509544     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)