Impedance spectroscopic analysis of ac response of nanophase ZnO and ZnO-Al2O3 nanocomposites

Nanostructured Materials

Volumn 11, Issue 8, 1999, Pages 1091-1099

  Jose, Joshy ^a   Khadar, M Abdul ^b  

^a MAHATMA GANDHI UNIVERSITY   (India)

^b UNIVERSITY OF KERALA   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BAND STRUCTURE; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY OF SOLIDS; GRAIN BOUNDARIES; PARTICLE SIZE ANALYSIS; PRECIPITATION (CHEMICAL); SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

AC ELECTRICAL RESPONSE; IMPEDANCE SPECTROSCOPIC ANALYSIS; X RAY LINE BROADENING;

NANOSTRUCTURED MATERIALS;

EID: 0033298966     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(99)00399-2     Document Type: Article

References (42)

1. Marquardt P. Phys. Lett. 123:1987;365.
2. Frahm F., Mühlschlegel B., Németh R. Z. Phys. B. Condensed Matter. 78:1990;91.
3. Chi-mei M., Lide Z., Guouzhong W. Nanostruct. Mater. 6:1995;823.
4. Chiang Y.-M., Lavik E.B., Blom D.A. Nanostruct. Mater. 9:1997;633.
5. Nan C.-W., Holten S., Birringer R., Gao H., Kliem H., Gleiter H. Phys. Stat. Sol. (a). 164:1997;R1.
6. de Jongh P.E., Vanmaekelbergh D. Phys. Rev. Lett. 77:1996;3427.
7. Snow A.W., Wohltjen H. Chem. Mater. 10:1998;947.
8. Lee J., Hwang J.H., Mashek J.J., Mason T.O., Miller A.E., Siegel R.W. J. Mater. Res. 10:1995;2295.
9. Puin W., Heitjans P. Nanostruct. Mater. 6:1995;885.
10. Abdul M. Khadar and B. Thomas, Phys. Stat. Sol. (a). 150:1995;755.
11. Komarneni S. J. Mater. Chem. 2:1992;1219.
12. Thomas B., Abdul M. Khadar, Pramana J. Phys. 45:1995;431.
13. Abdul Khadar M., Thomas B. Nanostruct. Mater. 10:1998;593.
14. Singhal M., Chhabra V., Kang P., Shah D.O. Mater. Res. Bull. 32:1997;239.
15. Hingorani S., Pillai V., Kumar P., Multani M.S., Shah D.O. Mater. Res. Bull. 28:1993;1303.
16. Viswanath R.N., Ramasamy S., Ramamoorthy R., Jayavel P., Nagarajan T. Nanostruct. Mater. 6:1995;993.
17. Dong L.F., Cui Z.L., Zhang Z.K. Nanostruct. Mater. 8:1997;815.
18. Lin H.-M., Tzeng S.-J., Hsiau P.-J., Tsai W.-L. Nanostruct. Mater. 10:1998;465.
19. Frans C.M., Van De Pol. Ceram. Bull. 69:1990;1959.
20. Rensmo H., Keis K., Lindström H., Södergren S., Solbrand A., Hagfeldt A., Lindquist S.-E., Wang L.N., Muhammed M. J. Phys. Chem. B. 101:1997;2598.
21. Srikant V., Sergo V., Clarke D.R. J. Am. Ceram. Soc. 78:1995;1935.
22. Sato H., Minami T., Tamura Y., Takata S. Thin Solid Films. 246:1994;86.
23. Tang W., Cameron D.C. Thin Solid Films. 238:1994;83.
24. Zabinski J.S., Corneille J., Prasad S.V., McDevitt N.T., Bultman J.B. J. Mater. Sci. 32:1997;5313.
25. Hagemark K.I., Solid J. State Chem. 16:1976;293.
26. Natsume Y., Sakata H., Hirayama T. Phys. Stat. Sol. (a). 148:1995;485.
27. Ziegler E., Heinrich A., Opperman H., Stöver G. Phys. Stat. Sol. (a). 6:1981;635.
28. Siegel R.W. J. Phys. Chem. Solids. 559:1994;1097.
29. Birringer R. Mater. Sci. Eng. A117:1989;33.
30. Suryanarayana C. Bull. Mater. Sci. 17:1994;307.
31. Gleiter H. Progr. Mater. Sci. 33:1989;223.
32. MacDonald J.R. Impedance Spectroscopy, Emphasizing Solid Materials and Systems. 1987;John Wiley & Sons, New York.
33. Abdullah M.H., Yusoff A.N. J Mater. Sci. 32:1997;5817.
34. Upadhyay S., Kumar D., Parkash O. Bull. Mater. Sci. 19:1996;513.
35. Ohtaki M., Tsubota T., Eguchi K., Arai H. J. Appl. Phys. 79:1996;1816.
36. Zhao D., Pan X. J. Vac. Sci. Technol. B. 12:(5):1994;2880.
37. Mo C., Yuan Z., Zhang L., Xie C. Nanostruct. Mater. 2:1993;47.
38. Klug H.P., Alexander L.E. X-ray Powder Diffraction Procedure. 1954;504 John Wiley & Sons, New York.
39. Blatter G., Greuter F. Physical Review B. 33:(6):1986;3952.
40. Hutson A.R. Phys. Rev. Lett. 4:1960;505.
41. Jow T., Wagner J.B. Jr., J. Electrochem. Soc. Solid-State Sci. Technol. 126:1979;1963.
42. Corrias A., Ennas G., Paschina G., Piccaluga G., Zedda D. Mater. Sci. Forum. 195:1995;25.