Test case generation and reduction by automated input-output analysis

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 1, Issue , 2003, Pages 768-773

  Saraph, Prachi ^a   Last, Mark ^b   Kandell, Abraham ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Artificial neural networks; Feature ranking; Input output analysis; Rule extraction; Software testing; Test cases

Indexed keywords

ALGORITHMS; AUTOMATION; COMPUTER SOFTWARE; COMPUTER SOFTWARE SELECTION AND EVALUATION; DATA MINING; DECISION THEORY; FUZZY SETS; INPUT OUTPUT PROGRAMS;

AUTOMATED INPUT OUTPUT ANALYSIS; BLACK BOX TEST; INFO-FUZZY-NETWORKS; SOFTWARE TESTING PROCESS; SOFTWARE TESTING RESOURCES;

NEURAL NETWORKS;

EID: 0242492195     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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