Black-box test reduction using input-output analysis

Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis

Volumn , Issue , 2000, Pages 173-177

  Schroeder, Patrick J ^a   Korel, Bogdan ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Black box Testing; Combinatorial Testing; Input Output Analysis; Test Reduction

Indexed keywords

BOUNDARY VALUE PROBLEMS; COMPUTER PROGRAMMING; INPUT OUTPUT PROGRAMS; TESTING;

BLACK-BOX TESTING;

COMPUTER SOFTWARE;

EID: 0034592704     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/347324.349042     Document Type: Conference Paper

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