Distance metric learning by knowledge embedding

Pattern Recognition

Volumn 37, Issue 1, 2004, Pages 161-163

  Zhang, Yun Gang ^a   Zhang, Chan Shui ^a   Zhang, David ^b  

^a TSINGHUA UNIVERSITY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Clustering; Distance metric learning; Knowledge embedding

Indexed keywords

PROBLEM SOLVING;

KNOWLEDGE EMBEDDING;

PATTERN RECOGNITION;

ALGORITHM;

EID: 0242489578     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(03)00218-8     Document Type: Article

References (5)

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3. Jain A.K. Duin R.P.W. Mao J. Statistical pattern recognition: A review IEEE Trans. Pattern Anal. Machine Intell. 22 2000 4-37
4. Tenenbaum J.B. de Silva V. Langford J.C. A global geometric framework for nonlinear dimensionality reduction Science 290 2000 2319-2323
5. Roweis S.T. Saul L.K. Nonlinear dimensionality reduction by locally linear embedding Science 290 2000 2323-2326